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Publications by Tim Grieb
Measurement of Strain in Nanoporous Gold Using Nano-Beam Electron Diffraction
Measurement of Diffraction Pattern Distortions for Quantitative STEM
Related publications
Nano Structures Studied by Convergent Beam Electron Diffraction
Acta Crystallographica Section A Foundations of Crystallography
Profiling Strain in Thin Buried Layers by Convergent-Beam Electron-Diffraction Techniques
Acta Crystallographica Section A Foundations of Crystallography
Quantitative Convergent Beam Electron Diffraction
Microscopy and Microanalysis
Instrumentation
Quantitative Convergent Beam Electron Diffraction
Materials Transactions, JIM
Analysis of Strain State of Semiconductor Structures by Large-Angle Convergent Electron Beam Diffraction
Acta Crystallographica Section A Foundations of Crystallography
Using STEM Image as a Map for Parallel Beam Electron Diffraction From a Nano-Particle on a TEM-STEM System
Microscopy and Microanalysis
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Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled With Precession
Microscopy and Microanalysis
Instrumentation
Electron-Beam Induced Nano-Etching of Suspended Graphene
Scientific Reports
Multidisciplinary
Convergent Beam Electron Diffraction of Ordered L10 Nanoparticles
Microscopy and Microanalysis
Instrumentation
