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Publications by Tobias U. Schülli
Imaging Structure and Composition Homogeneity of 300 Mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-Ray Diffraction Microscopy
ACS Applied Materials & Interfaces
Medicine
Materials Science
Nanotechnology
Nanoscience
Grazing-Incidence X-Ray Diffraction of Single GaAs Nanowires at Locations Defined by Focused Ion Beams
Journal of Applied Crystallography
Biochemistry
Genetics
Molecular Biology
Related publications
Imaging Fully Hydrated Whole Cells by Coherent X-Ray Diffraction Microscopy
Physical Review Letters
Astronomy
Physics
Scanning Transmission Ion Microscopy and Diffraction Imaging
Microscopy and Microanalysis
Instrumentation
Multiscale X-Ray Analysis of Biological Cells and Tissues by Scanning Diffraction and Coherent Imaging
Göttingen Series in x-ray Physics
An Incommensurate Reconstruction Studied With Scanning Tunnelling Microscopy and Surface X-Ray Diffraction
Microscopy Microanalysis Microstructures
X-Ray Nanospectroscopic Research With Scanning Transmission X-Ray Microscopy
Journal of the Vacuum Society of Japan
Surfaces
Instrumentation
Interfaces
Spectroscopy
Materials Science
Dislocation Studies in Diamond by X-Ray Diffraction Microscopy
Three-Dimensional Imaging of Nanoscale Internal Structure by Coherent X-Ray Diffraction Microscope
Materia Japan
Combined Control of Aluminum Bath Composition by X-Ray Diffraction and X-Ray Fluorescence Analysis
X-Ray Spectrometry
Spectroscopy
Studies of Archaeologicals by X Ray Imaging, Fluorescence and Diffraction
Acta Crystallographica Section A Foundations of Crystallography
