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Publications by Tomas Vystavel
Non-Destructive Characterization of Extended Crystalline Defects in Confined Semiconductor Device Structures
Nanoscale
Materials Science
Nanotechnology
Nanoscience
Optimized Electron Column and Detection Scheme for Advanced Imaging and Analysis of Metals
Microscopy and Microanalysis
Instrumentation
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Non-Destructive Characterization of Nitrogen-Implanted Silicon-On-Insulator Structures by Spectroscopic Ellipsometry
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Mechanics of Materials
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Condensed Matter Physics
Mechanical Engineering
Non-Destructive Characterization of Stony Meteorites
Atom-Probe Tomography of Semiconductor Materials and Device Structures
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Non-Equilibrium Green’s Functions in Semiconductor Device Modeling
Non-Destructive Characterization of Superionic Conductor: Lithium Nitride
Materials Science-Poland
Mechanics of Materials
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Condensed Matter Physics
Mechanical Engineering
Non-Destructive Test of Steel Structures by Conical Indentation
MATEC Web of Conferences
Materials Science
Engineering
Chemistry
Crystalline Characterization of TlBr Semiconductor Detectors Using Wavelength-Resolved Neutron Imaging
Sensors and Materials
Materials Science
Instrumentation
Elements of Structures and Defects of Crystalline Materials by Tsang-Tse Fang
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Non-Destructive Method for Rapid "In Situ" Characterization of Rocks
Bulletin of the Geological Society of Greece
