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Publications by Tomokazu YONEDA
Test Pattern Ordering and Selection for High Quality Test Set Under Constraints
IEICE Transactions on Information and Systems
Electronic Engineering
Pattern Recognition
Hardware
Computer Vision
Electrical
Architecture
Artificial Intelligence
Software
Related publications
An Integrated Technique for Test Vector Selection and Test Scheduling Under Test Time Constraint
A Design for a High Voltage Magnet Coil Ringer Test Set
Test Time Feature Ordering With FOCUS
Sparrow Test Set Improvements.
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
Regression Test Selection for C# Programs
Advances in Software Engineering
Test Wrapper Design and Optimization Under Power Constraints for Embedded Cores With Multiple Clock Domains
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
Minimum Verification Test Set for Combinational Circuit
Submarine Escape Set Test Facilities
Defence Science Journal
Electronic Engineering
Mechanical Engineering
Physics
Computer Science Applications
Electrical
Chemical Engineering
Astronomy
Biomedical Engineering
