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Publications by Tomokuni MITSUISHI
A New Type of Interference Fringes Observed in Electron-Micrograph of Crystalline Substance
Proceedings of the Japan Academy
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Figure 1: The Electron Micrograph of Bacterium QT520 (X6000).
Directly Measuring the Degree of Quantum Coherence Using Interference Fringes
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Nanometric Displacement Measurement Based on Interference Fringes Deflection
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Interference Fringes in the Plane Wave Topographic Images of Growth Bands in Si:Ge
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Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy
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First Report of the Electron Micrograph of "Candidatus Liberibacter" Particles on Citrus in Brazil
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Figure 3: Scanning Electron Micrograph of Chlorella Spp. Under Photoautotrophic and Mixotrophic Conditions.