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Publications by Tong-Ho Kim

Ultraviolet–Visible Plasmonic Properties of Gallium Nanoparticles Investigated by Variable-Angle Spectroscopic and Mueller Matrix Ellipsometry

Electronic Engineering

Molecular Physics,

Magnetic Materials

English

Demonstration of Surface-Enhanced Raman Scattering by Tunable, Plasmonic Gallium Nanoparticles

Journal of the American Chemical Society

Surface Chemistry

English

Related publications

InP Optical Constants Between 0.75 and 5.0 eV Determined by Variable‐angle Spectroscopic Ellipsometry

Journal of Applied Physics

English

Mueller Matrix Imaging Ellipsometry for Nanostructure Metrology

Molecular Physics,

English

Critical Dimension Metrology of a Plasmonic Photonic Crystal Based on Mueller Matrix Ellipsometry and the Reduced Rayleigh Equation

Molecular Physics,

English

Studies on Inx(As2Se3)1-X Thin Films Using Variable Angle Spectroscopic Ellipsometry (VASE)

Materials Science-Poland

Mechanics of Materials

Materials Science

Condensed Matter Physics

Mechanical Engineering

English

Electromagnon Excitation in Cupric Oxide Measured by Fabry-Pérot Enhanced Terahertz Mueller Matrix Ellipsometry

Scientific Reports

Multidisciplinary

English

Comprehensive Characterization of a General Composite Waveplate by Spectroscopic Mueller Matrix Polarimetry

Molecular Physics,

English

Absorption Properties of Type-Ii InAs/InAsSb Superlattices Measured by Spectroscopic Ellipsometry

Applied Physics Letters

English

Dispersion of Polarization Coupling, Localized and Collective Plasmon Modes in a Metallic Photonic Crystal Mapped by Mueller Matrix Ellipsometry

Molecular Physics,

English