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Publications by Tony Owens
Measuring the Strain Sensitivity in Si (001) Electron Channeling Patterns Using Higher-Order Laue Zone Line Shifts
Microscopy and Microanalysis
Instrumentation
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Site-Selective Spectroscopy Using Electron Channeling-Demonstration for Al/Si Order Determination in Sillimanite
Nihon Kessho Gakkaishi
Linear Unification of Higher-Order Patterns
Lecture Notes in Computer Science
Computer Science
Theoretical Computer Science
Energetics of Si(001)
Reviews of Modern Physics
Astronomy
Physics
Recognition of Higher Order Patterns in Proteins: Immunologic Kernels
PLoS ONE
Multidisciplinary
The Use of Electron Channeling Patterns for Process Optimization of Low-Temperature Epitaxial Silicon Using Hot-Wire Chemical Vapor Deposition
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Effect of Strain on the Appearance of Subcritical Nuclei of Ge Nanohuts on Si(001)
Physical Review Letters
Astronomy
Physics
Strain-Induced Asymmetric Line Segregation at Faceted Si Grain Boundaries
Physical Review Letters
Astronomy
Physics
Fast Identification of Cracks Using Higher-Order Topological Sensitivity for 2-D Potential Problems
Engineering Analysis with Boundary Elements
Computational Mathematics
Engineering
Applied Mathematics
Analysis
Observation of Substructure in Steels and Ni200 Using Electron-Channeling Contrast Imaging
Microscopy and Microanalysis
Instrumentation
