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Publications by Travis Eiles

Nanoscale X-Ray Imaging of Circuit Features Without Wafer Etching

Physical Review B

Condensed Matter Physics

Magnetic Materials

English

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Three-Dimensional Imaging of Nanoscale Internal Structure by Coherent X-Ray Diffraction Microscope

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In Operando X-Ray Imaging of Nanoscale Devices: Composition, Valence, and Internal Electrical Fields

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Nanoscale Imaging of Buried Structures With Elemental Specificity Using Resonant X-Ray Diffraction Microscopy

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Soft X-Ray Spectroscopy Study of Nanoscale Materials

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X-Ray Polarization Imaging

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Three-Dimensional Coherent X-Ray Diffraction Imaging of Molten Iron in Mantle Olivine at Nanoscale Resolution

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Etching Technologies of Silicon Wafer Using Dry Process

Journal of The Surface Finishing Society of Japan

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Single-Particle Imaging Without Symmetry Constraints at an X-Ray Free-Electron Laser

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Fast X-Ray Differential Phase Contrast Imaging With One Exposure and Without Movements

Scientific Reports

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