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Publications by U. Zeile

Focused Ion Beam Preparation Techniques for EFTEM Analysis

Microscopy and Microanalysis

Instrumentation

English

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A Plan-View TEM Specimen Preparation Method Using Focused Ion Beam

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A Sample Preparation Method for Paper Cross-Sections Using a Focused Ion Beam.

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Targeting Ion Beam Analysis Techniques for Gold Artefacts

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High Throughput Sample Preparation and Analysis Using an Inductively Coupled Plasma (ICP) Focused Ion Beam Source

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Dual-Beam Focused Ion Beam: A Multifunctional Tool for Nanotechnology

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Focused Ion Beam Technique for Surface and Interface Analysis of Steel Sheets

Journal of The Surface Finishing Society of Japan

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