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Publications by Uli Dahmen
Introduction: The Otto Scherzer Special Issue on Aberration-Corrected Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Related publications
Introduction: Opportunities, Artifacts, and Interpretation of Aberration-Corrected Electron Microscopy Data
Microscopy and Microanalysis
Instrumentation
Aberration Corrected Photoemission Electron Microscopy With Photonics Applications
Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science
Microscopy and Microanalysis
Instrumentation
Studying the Atomic Structures by Aberration-Corrected and Conventional Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review
Microscopy and Microanalysis
Instrumentation
Aberration-Corrected Precession Electron Diffraction
Microscopy and Microanalysis
Instrumentation
The superSTEM: An Aberration Corrected Analytical Microscopy Facility
Microscopy and Microanalysis
Instrumentation
Recent Studies of Oxide-Semiconductor Heterostructures Using Aberration-Corrected Scanning Transmission Electron Microscopy
Journal of Materials Research
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Efficient Elastic Imaging of Single Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
