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Publications by V. Barec
Atomic Scale Thickness Control of SOI Wafers for Fully Depleted Applications
ECS Transactions
Engineering
Related publications
Double-Gate Fully-Depleted SOI Transistors for Low-Power High-Performance Nano-Scale Circuit Design
A Back-Illuminated Time-Of-Flight Image Sensor With SOI-Based Fully Depleted Detector Technology for LiDAR Application
Proceedings
Implant Metrology for Bonded SOI Wafers Using a Surface Photo-Voltage Technique
Very Low Energy Implanted Bragg Gratings in SOI for Wafer Scale Testing Applications
Challenges of Smaller Particle Detection on Both Bulk-Silicon and SOI Wafers
AIP Conference Proceedings
Astronomy
Physics
Modeling and Control of State-Affine Probabilistic Systems for Atomic-Scale Dynamics
Fully Integrated SOI Wavelength Meter Based on Phase Shift Technique
Atomic Scale Catalysts: Atomic Scale Materials for Emerging Robust Catalysis (Small Methods 11/2018)
Small Methods
Materials Science
Chemistry
Compact Threshold-Voltage Model for Short-Channel Partially-Depleted (PD) SOI Dynamic-Threshold MOS (DTMOS) Devices
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
