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Publications by V. Y. Gertsman
Preparation of Transmission Electron Microscope Specimens From Ultra-Fine Fibers by a FIB Technique
Microscopy and Microanalysis
Instrumentation
Related publications
Various Specimen Preparation Methods for Transmission Electron Microscope
Journal of the Japan Society of Colour Material
Routine Preparation of Seminal Fluid Specimens for Transmission Electron Microscopy
Journal of Clinical Pathology
Medicine
Forensic Medicine
Pathology
Transforming a Thermionic Transmission Electron Microscope Into an Electron Interferometer
Microscopy and Microanalysis
Instrumentation
Self-Consistent Method for Quantifying Indium Content From X-Ray Spectra of Thick Compound Semiconductor Specimens in a Transmission Electron Microscope
Journal of Microscopy
Forensic Medicine
Pathology
Histology
Observation of the Fine Structure of Manganese Compounds by Electron Microscope.
NIPPON KAGAKU KAISHI
Experimental Design of Exit Wave Reconstruction From a Transmission Electron Microscope Defocus Series
IEEE Transactions on Instrumentation and Measurement
Electronic Engineering
Electrical
Instrumentation
Analysis of Crystal Defects by Scanning Transmission Electron Microscopy (STEM) in a Modern Scanning Electron Microscope
Advanced Structural and Chemical Imaging
Nuclear Medicine
Radiology
Chemical Engineering
Spectroscopy
Imaging
Three-Dimensional Microstructural Visualization of Mitosis Using Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) and 3Mv Ultra-High Voltage Electron Microscope (UHVEM) Tomography With Nanoscale Resolution at Whole Cell Level
Biophysical Journal
Biophysics
Ultra-Thin TEM Sample Preparation With Advanced Backside FIB Milling Method
Microscopy and Microanalysis
Instrumentation
