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Publications by W. Shimoyama
Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
Microscopy and Microanalysis
Instrumentation
Related publications
Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope
Microscopy and Microanalysis
Instrumentation
Efficient Elastic Imaging of Single Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Imaging ZnO Nanobelts and Nanobelt Supported Metal Nanocatalysts by Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Sub-Ångstrom Low-Voltage Performance of a Monochromated, Aberration-Corrected Transmission Electron Microscope
Microscopy and Microanalysis
Instrumentation
Observations of Carbon Nanotube Oxidation in an Aberration-Corrected Environmental Transmission Electron Microscope
ACS Nano
Materials Science
Nanoscience
Engineering
Nanotechnology
Astronomy
Physics
Study of Phase Separation in an InGaN Alloy by Electron Energy Loss Spectroscopy in an Aberration Corrected Monochromated Scanning Transmission Electron Microscope
Journal of Materials Research
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Recent Studies of Oxide-Semiconductor Heterostructures Using Aberration-Corrected Scanning Transmission Electron Microscopy
Journal of Materials Research
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Depth Sectioning of Individual Dopant Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Applied Physics Letters
Astronomy
Physics
Structure and Composition Analysis of Core-Shell Structure Bimetallic Concave Nanocubes by Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
