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Publications by W. Theis
Tungsten Tips as a Sample Platform for Single Atom Resolution S/Tem Tomography of Clusters and Interfaces
Microscopy and Microanalysis
Instrumentation
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Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)
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Three Dimensional Atom Probe Tomography of Nanoscale Thin Films, Interfaces and Particles
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Abundances and Kinematics for a Sample of LMC Clusters
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Marriage of Focused and Broad Ion Beam: Sample Preparation Optimized for High Performance Analytical (S)TEM
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