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Publications by Weichao Du
Mueller Matrix Imaging Ellipsometry for Nanostructure Metrology
Optics Express
Optics
Atomic
Molecular Physics,
Related publications
Critical Dimension Metrology of a Plasmonic Photonic Crystal Based on Mueller Matrix Ellipsometry and the Reduced Rayleigh Equation
Optics Letters
Optics
Atomic
Molecular Physics,
Robust Overlay Metrology With Differential Mueller Matrix Calculus
Optics Express
Optics
Atomic
Molecular Physics,
Metrology of Nanostructures by Tomographic Mueller-Matrix Scatterometry
Applied Sciences (Switzerland)
Instrumentation
Materials Science
Fluid Flow
Engineering
Computer Science Applications
Process Chemistry
Transfer Processes
Technology
Ultrasensitive Broadband Infrared 4 × 4 Mueller-Matrix Ellipsometry for Studies of Depolarizing and Anisotropic Thin Films
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
Electromagnon Excitation in Cupric Oxide Measured by Fabry-Pérot Enhanced Terahertz Mueller Matrix Ellipsometry
Scientific Reports
Multidisciplinary
GDx-MM: An Imaging Mueller Matrix Retinal Polarimeter
Detection and Discrimination of Bacterial Colonies With Mueller Matrix Imaging
Scientific Reports
Multidisciplinary
Ultraviolet–Visible Plasmonic Properties of Gallium Nanoparticles Investigated by Variable-Angle Spectroscopic and Mueller Matrix Ellipsometry
ACS Photonics
Electronic Engineering
Electronic
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Biotechnology
Optics
Study of Cell-Matrix Adhesion Dynamics Using Surface Plasmon Resonance Imaging Ellipsometry
Biophysical Journal
Biophysics
