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Publications by Wojciech Ogieglo
Ultrasensitive Broadband Infrared 4 × 4 Mueller-Matrix Ellipsometry for Studies of Depolarizing and Anisotropic Thin Films
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes
Related publications
Anisotropic Integral Decomposition of Depolarizing Mueller Matrices
OSA Continuum
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
Mueller Matrix Imaging Ellipsometry for Nanostructure Metrology
Optics Express
Optics
Atomic
Molecular Physics,
Broadband Loss-Less Optical Thin-Film Depolarizing Devices
Optics Express
Optics
Atomic
Molecular Physics,
Ellipsometry of Unsupported and Embedded Thin Films
Le Journal de Physique Colloques
Morphology and Spectroscopic Ellipsometry of PMMA Thin Films
Applied Physics Research
Thermally Tunable Ultrasensitive Infrared Absorption Spectroscopy Platforms Based on Thin Phase-Change Films
ACS Sensors
Instrumentation
Fluid Flow
Process Chemistry
Transfer Processes
Bioengineering
Technology
Magneto-Optic Ellipsometry Characterization of Co and SmCo Thin Films
Photonics Letters of Poland
Optical
Electronic
Magnetic Materials
Mueller Matrix Approach for Probing Multifractality in the Underlying Anisotropic Connective Tissue
Journal of Biomedical Optics
Electronic
Optics
Molecular Physics,
Optical
Biomaterials
Atomic
Magnetic Materials
Biomedical Engineering
