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Publications by Wojciech Ogieglo
Ultrasensitive Broadband Infrared 4 × 4 Mueller-Matrix Ellipsometry for Studies of Depolarizing and Anisotropic Thin Films
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes
