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Publications by X Zhai
Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS
Microscopy and Microanalysis
Instrumentation
The Atomic Structure of Oxide Superlattices Revealed by Fine Electron Probes
Microscopy and Microanalysis
Instrumentation
Related publications
Atomic-Resolution EELS in Aberration-Corrected STEM
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Aberration-Corrected STEM for Elemental Mapping
Microscopy and Microanalysis
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Aberration Corrected STEM-EELS Study of the Hole Distribution in Cuprate Superconductors
Microscopy and Microanalysis
Instrumentation
Aberration-Corrected ETEM: In-Situ Reduction of Cobalt Oxides
Microscopy and Microanalysis
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The Ultimate Resolution in Aberration-Corrected STEM
Microscopy and Microanalysis
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Surface Channeling in Aberration-Corrected STEM of Nanostructures
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Nanomilling for Aberration – Corrected TEM and HAADF STEM
Microscopy and Microanalysis
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Understanding Catalyst Stability Through Aberration-Corrected STEM
Microscopy and Microanalysis
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Using Neural Network Algorithms for Compositional Mapping in STEM EELS
Microscopy and Microanalysis
Instrumentation
