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Publications by Y.K. Malaiya
An Examination of Fault Exposure Ratio
IEEE Transactions on Software Engineering
Software
ECL Storage Elements: Modeling of Faulty Behavior
IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
Antirandom Testing: Getting the Most Out of Black-Box Testing
X-Iddq: A Novel Defect Detection Technique Using IDDQ Data
Requirements Volatility and Defect Density
