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Publications by Yaqing Chi
Investigation of Heavy-Ion Induced Single-Event Transient in 28 Nm Bulk Inverter Chain
Symmetry
Mathematics
Chemistry
Physics
Computer Science
Astronomy
Related publications
Heavy-Ion Induced Single Event Upsets in Advanced 65 Nm Radiation Hardened FPGAs
Electronics (Switzerland)
Control
Electronic Engineering
Signal Processing
Computer Networks
Systems Engineering
Hardware
Communications
Electrical
Architecture
Measurements and Simulations of Single-Event Upsets in a 28-Nm FPGA
Radiation Hardness Evaluations of 65 Nm Fully Depleted Silicon on Insulator and Bulk Processes by Measuring Single Event Transient Pulse Widths and Single Event Upset Rates
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Single Event Upsets Under 14-MeV Neutrons in a 28-Nm SRAM-based FPGA in Static Mode
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Investigation of Ion Backflow in Bulk Micromegas Detectors
Journal of Instrumentation
Instrumentation
Mathematical Physics
Heavy Ion Induced Single Event Effects Characterization on an RF-Agile Transceiver for Flexible Multi-Band Radio Systems in NewSpace Avionics
Aerospace
Aerospace Engineering
Characterization of GigaRad Total Ionizing Dose and Annealing Effects on 28 Nm Bulk MOSFETs
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Event Generators for Heavy-Ion Physics, Recent Developments
Breakup Processes in Heavy-Ion Induced Reactions
Physical Review C
