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Publications by Yingbo Liu
Reliability of Buried InGaAs Channel N-MOSFETs With an InP Barrier Layer and Al2O3 Dielectric Under Positive Bias Temperature Instability Stress
Frontiers in Physics
Materials Science
Biophysics
Theoretical Chemistry
Mathematical Physics
Astronomy
Physics
Physical
Modeling the Process of Event Sequence Data Generated for Working Condition Diagnosis
Mathematical Problems in Engineering
Mathematics
Engineering
