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Publications by Yoichi Miyahara

Optical Excitation of Atomic Force Microscopy Cantilever for Accurate Spectroscopic Measurements

EPJ Techniques and Instrumentation

English

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Pulsed Contact Resonance for Atomic Force Microscopy Nanomechanical Measurements

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Atomic Force and Optical Microscopy Align Themselves

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Nanoscale Optical Imaging by Atomic Force Infrared Microscopy

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A System for Performing Simultaneous in Situ Atomic Force Microscopy/Optical Microscopy Measurements on Electrode Materials for Lithium-Ion Batteries

Review of Scientific Instruments

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Atomic Force Microscopy of Reovirus dsRNA: A Routine Technique for Length Measurements

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Atomic Force Microscopy

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Compliance Measurements of Confined Polystyrene Solutions by Atomic Force Microscopy

Physical Review Letters

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Nanomechanical and Viscoelastic Measurements in Biological Atomic Force Microscopy (AFM)

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High Speed Tapping Mode Atomic Force Microscopy in Liquid Using an Insulated Piezoelectric Cantilever

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