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Publications by Yoshihiro Irokawa

Mapping of a Lattice-Plane Tilting in a GaN Wafer Using Energy-Resolved X-Ray Diffraction Topography

Physical Review Applied

English

Lattice-Plane Bending Angle Modulation of Mg-Doped GaN Homoepitaxial Layer Observed by X-Ray Diffraction Topography

Materials Science

Condensed Matter Physics

English

Related publications

Depth Resolved Snapshot Energy-Dispersive X-Ray Diffraction Using a Conical Shell Beam

Molecular Physics,

English

X-Ray Diffraction Topography

English

X-Ray Diffraction Topography

English

Current Developments in Time-Resolved X-Ray Diffraction

Crystallography Reviews

Materials Science

Condensed Matter Physics

Structural Biology

English

Anomalous Lattice Deformation in GaN/SiC(0001) Measured by High-Speed in Situ Synchrotron X-Ray Diffraction

Applied Physics Letters

English

Energy-Dispersive X-Ray Diffraction Using an Annular Beam

Molecular Physics,

English

Studies of Electron Diffusion in Photo-Excited Ni Using Time-Resolved X-Ray Diffraction

Applied Physics Letters

English

In-Situ Observation of Weld Solidification Using Two-Dimensional Time-Resolved X-Ray Diffraction

Yosetsu Gakkai Shi/Journal of the Japan Welding Society

Mechanics of Materials

Mechanical Engineering

English