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Publications by Yoshiro SHIOKAWA
In-Situ Analysis of Perfluoro Compounds in Semiconductor Process Exhaust by Ion Attachment Mass Spectrometry (IAMS).
SHINKU
Development of Micro AUGER/SIMS Analysis System. I.
SHINKU
Related publications
Easily Fabricated Ion Source for Characterizing Mixtures of Organic Compounds by Direct Analysis in Real Time Mass Spectrometry
Analytical Methods
Engineering
Analytical Chemistry
Chemical Engineering
Mass Spectrometry of Volatile Organic Compounds as Biomarkers in Breath Analysis
Journal of the Mass Spectrometry Society of Japan
Characterization of Organic Tin Compounds by Mass Spectrometry.
NIPPON KAGAKU KAISHI
Quantitative Analysis of Zn-Fe Alloy Galvanized Layer by Secondary Ion Mass Spectrometry
Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
Alloys
Condensed Matter Physics
Metals
Theoretical Chemistry
Materials Chemistry
Physical
Polymerization in Situ Accompanying Field Desorption Mass Spectrometry
Canadian Journal of Chemistry
Organic Chemistry
Catalysis
Chemistry
Analysis of Long-Chain Fatty Acyl Coenzyme a Thioesters by Negative Ion Fast-Atom Bombardment Mass Spectrometry and Tandem Mass Spectrometry
Journal of the American Society for Mass Spectrometry
Structural Biology
Spectroscopy
Secondary Ion Mass Spectrometry (SIMS)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
Alloys
Metals
Materials Chemistry
Electrochemistry
Films
Coatings
Vacuum In-Situ Process for Semiconductor Materials and Devices.
SHINKU
Development of Lithium Attachment Mass Spectrometry – Knudsen Effusion and Chemical Ionisation Mass Spectrometry (KEMS, CIMS)
Analyst, The
Biochemistry
Environmental Chemistry
Analytical Chemistry
Electrochemistry
Spectroscopy
