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Publications by Yukari Oohashi
Measurement of Electron Emission Yield of Insulators Without Charging Using SEM
IEEJ Transactions on Electronics, Information and Systems
Electronic Engineering
Electrical
Related publications
Measurement of Secondary Electron Yield of Wall Materials Using Auger Electron Spectrometer.
SHINKU
Electron Emission From Insulators Irradiated by Slow Highly Charged Ions
e-Journal of Surface Science and Nanotechnology
Surfaces
Mechanics of Materials
Condensed Matter Physics
Interfaces
Nanoscience
Bioengineering
Films
Biotechnology
Coatings
Nanotechnology
Characterization of Polymers and Catalysts Using Scanning Transmission Electron Microscopy (STEM) in a Field Emission SEM
Microscopy and Microanalysis
Instrumentation
The Role of Secondary Electron Emission in the Charging of Thin-Film Phase Plates
Microscopy and Microanalysis
Instrumentation
Triggering Threshold Spacecraft Charging With Changes in Electron Emission From Materials
Sharp Reduction of the Secondary Electron Emission Yield From Grooved Surfaces
Journal of Applied Physics
Astronomy
Physics
Uniform Charging Energy of Single-Electron Transistors by Using Size-Controlled Au Nanoparticles
Applied Physics Letters
Astronomy
Physics
Workshop on High-Resolution Immunocytochemistry of Cell Surfaces Using Field Emission SEM.
Journal of Histochemistry and Cytochemistry
Anatomy
Histology
FAC-SEM Using PLS-SEM: An Empirical Illustration in a Customer Value Measurement Context
