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Publications by Z. M. Rittersma
Effect of Nitridation on Low-Frequency (1/F) Noise in N- And P-Mosfets With HFO[sub 2] Gate Dielectrics
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
Related publications
Gate Voltage Dependent 1/F Noise Variance Model in N-Channel MOSFETs
Noise in Si and SiGe MOSFETs With High-K Gate Dielectrics
AIP Conference Proceedings
Astronomy
Physics
Linearity and Mobility Degradation in Strained Si MOSFETs With Thin Gate Dielectrics
Solid-State Electronics
Electronic Engineering
Condensed Matter Physics
Materials Chemistry
Optical
Electrical
Magnetic Materials
Electronic
Ge MOS Capacitors With Thermally Evaporated HfO[sub 2] as Gate Dielectric
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
1/ F and RTS Noise in InGaAs Nanowire MOSFETs
Microelectronic Engineering
Surfaces
Electronic Engineering
Condensed Matter Physics
Electronic
Molecular Physics,
Nanoscience
Optical
Electrical
Atomic
Magnetic Materials
Films
Nanotechnology
Optics
Coatings
Low Frequency Noise (1/F ) Improvements on CMOS Transistors With a Single Nmm+ Doped Poly Si-SiGe Gate Stack
Low-Frequency Noise in High-K LaLuO3/TiN MOSFETs
Low-Frequency Noise in III-V Nanowire TFETs and MOSFETs
IEEE Electron Device Letters
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
The Effects of Nitridation and Re-Oxidation on Drain Leakage Current in N-Channel MOSFETs
