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Publications by Zhigang JIA

An Improved Scan Mode in an Electrostatic Force Microscope for Surface Profile Measurement of Micro-Optics

Journal of Advanced Mechanical Design, Systems and Manufacturing

Mechanical Engineering

Manufacturing Engineering

English

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Improved Sensitivity of Dual-Axis Micro-Mechanical Probe for Friction Force Microscope

Tribology Online

English

Influence of Surface Force on Motion of an Electrostatic Microstructure

IEEJ Transactions on Sensors and Micromachines

Electronic Engineering

Mechanical Engineering

English

Measurement of Corneal Elasticity With an Acoustic Radiation Force Elasticity Microscope

Ultrasound in Medicine and Biology

Ultrasound Technology

Nuclear Medicine

English

Surface Morphology of DLC Films Observed With an Atomic Force Microscope.

English

Experiment of Polarization Forces in Scanning Electrostatic Force Microscopy for Measuring Surface Profile of Dielectric

Open Electrical and Electronic Engineering Journal

Electronic Engineering

English

Surface Charge Measurement on Solid Dielectrics With an Electrostatic Probe

IEEJ Transactions on Fundamentals and Materials

Electronic Engineering

English

Stability Enhancement of an Atomic Force Microscope for Long-Term Force Measurement Including Cantilever Modification for Whole Cell Deformation

Review of Scientific Instruments

Instrumentation

English

Kinematics Parameters Estimation for an AFM/robot Integrated Micro-Force Measurement System

English

Electrification on Condensation Surface of Micro Particles With Atomic Force Microscope (AFM)

Journal of Photopolymer Science and Technology

Organic Chemistry

Materials Chemistry

English