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Publications by Zhongbo Lee
Chromatic Aberration Correction for Atomic Resolution TEM Imaging From 20 to 80 kV
Physical Review Letters
Astronomy
Physics
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STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging at ≤ 30 kV With No Aberration Correction for Nanomaterials on Graphene Support
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Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope
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Spherical Aberration Correction in TEM
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Precise Correction of Lateral Chromatic Aberration in Images
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Atomic-Resolution EELS in Aberration-Corrected STEM
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On Proper Phase Contrast Imaging in Aberration Corrected TEM
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Atomic Imaging in Aberration-Corrected HRTEM With Application to Al Alloys
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Chromatic-Aberration-Corrected Diffractive Lenses for Ultra-Broadband Focusing
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Nanomilling for Aberration – Corrected TEM and HAADF STEM
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