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Publications in Quality

New Thick-Film Microwave Elements for Microwave Integrated Circuits

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1984English

Development and Production of Hybrid Circuits for Microwave Radio Links

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1978English

Une Modelisation Bayesienne Du Taux De Defaillance en Fiabilite

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1983English

Reliability Analysis of Logic Circuits

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1975English

Pressure Coefficients for Band Gaps in Silicon

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1974English

Sensory Evaluation of Ground Beef Patties Irradiated by Gamma Rays Versus Electron Beam Under Various Packaging Conditions

Journal of Food Quality
QualityReliabilitySafetyRiskFood Science
2000English

An X-Ray Technique for Evaluating the Structure of Films for Device Applications

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1978English

Strange Temperature Characteristics of RuO2-based Thick Film Resistors

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1983English

On the Damage to Metallized Film Capacitors Caused by Electrical Discharges

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1976English

Reliability Inspection of Electronic Components From the Point of View of the Users

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1983English

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