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Publications in Quality

Standby Redundancy in Reliability—a Review

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1987English

Methyl Jasmonate Improves Quality of Stored Zucchini Squash

Journal of Food Quality
QualityReliabilitySafetyRiskFood Science
1999English

Logic Synthesis for Reliability: An Early Start to Controlling Electromigration and Hot-Carrier Effects

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1997English

Resistor Geometry Comparison With Respect to Current Noise and Trim Sensitivity

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1978English

Fast Reliability Qualification of SiP Products

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
2009English

A Reliability Growth Model

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1979English

Noise Investigations on Thick Film Resistors

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1984English

Two-Dimensional Numerical Simulations of 1/F Noise by GR Mechanisms in Thin Film Transistors: Effects of Induced Defect Technology

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
2007English

Products Liability: Component Part Manufacturer's Liability for Design and Warning Defects

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1990English

On the Use of Operations Research Models for Maintenance Decision Making

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1995English

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