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X‐ray Diffraction Fromdspacing Gradients Along Ion‐implanted Zones
Journal of Applied Physics
Astronomy
Physics
Triple Axis X‐ray Investigations of Semiconductor Surface Corrugations
Journal of Applied Physics
Astronomy
Physics
Super-X Divertors and High Power Density Fusion Devices
Physics of Plasmas
Condensed Matter Physics
Erratum: X‐Ray Diffraction Investigation of Β′‐NiAl Alloys
Journal of Applied Physics
Astronomy
Physics
Conformational Flexibility in Amidophosphoesters: A CSD Analysis Completed With Two New Crystal Structures of (C6H5O)2P(O)X [X = NHC7H13 and N(CH2C6H5)2]
Acta crystallographica. Section C, Structural chemistry
Condensed Matter Physics
Theoretical Chemistry
Inorganic Chemistry
Materials Chemistry
Medicine
Physical
Point‐Focus X‐Ray Monochromators for Low Angle Diffraction
Review of Scientific Instruments
Medicine
Instrumentation
Insight From Electron Density and Energy Framework Analysis on the Structural Features of F X -TCNQ (X = 0, 2, 4) Family of Molecules
Insight From Electron Density and Energy Framework Analysis on the Structural Features of F X -TCNQ (X = 0, 2, 4) Family of Molecules
Insight From Electron Density and Energy Framework Analysis on the Structural Features of F X -TCNQ (X = 0, 2, 4) Family of Molecules
Nitride Semiconductor Surfaces. Characterization of Initial Growth Stage of GaInN Multilayered Structure by X-Ray CTR Scattering and X-Ray Reflectivity Method.
Hyomen Kagaku
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