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Rietveld Quantitative X-Ray Diffraction Analysis of NIST Fly Ash Standard Reference Materials

Powder Diffraction - United States
doi 10.1017/s0885715600011015
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Abstract

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Categories
InstrumentationRadiationCondensed Matter PhysicsMaterials Science
Date

September 1, 2000

Authors
Ryan S. WinburnDean G. GrierGregory J. McCarthyRenee B. Peterson
Publisher

Cambridge University Press (CUP)


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