Towards Secondary Ion Mass Spectrometry on the Helium Ion Microscope: An Experimental and Simulation Based Feasibility Study With He+ and Ne+ Bombardment

Applied Physics Letters - United States
doi 10.1063/1.4739240
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

Secondary Ion Mass Spectrometry (SIMS)

Zairyo to Kankyo/ Corrosion Engineering
SurfacesAlloysMetalsMaterials ChemistryElectrochemistryFilmsCoatings
1993English

Secondary Ion Mass Spectrometry (SIMS)

English

Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope

Microscopy and Microanalysis
Instrumentation
2016English

20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)

Biointerphases
Materials ScienceAstronomyGeneticsMolecular BiologyBiochemistryBiomaterialsChemistryPhysics
2016English

Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities

Microscopy and Microanalysis
Instrumentation
2017English

Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging

Microscopy and Microanalysis
Instrumentation
2016English

Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images

Microscopy and Microanalysis
Instrumentation
2010English

Secondary Ion Mass Spectrometry Study of Erbium Titanium Codiffusion in Lithium Niobate

IEEE Photonics Technology Letters
Electronic EngineeringOpticsMolecular Physics,OpticalElectricalAtomicMagnetic MaterialsElectronic
2014English

Surface Damage of Stainless Steels by Helium Ion Bombardment

Transactions of the Japan Institute of Metals
1981English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy