Strain Resolution of Scanning Electron Microscopy Based Kossel Microdiffraction

Journal of Applied Crystallography - United Kingdom
doi 10.1107/s1600576714019402
Full Text
Abstract

Available in full text

Date
Authors
Publisher

International Union of Crystallography (IUCr)

Related search

High-Resolution Electron Microscopy and Microdiffraction of MgO–metal Composite Films

Acta Crystallographica Section A Foundations of Crystallography
1987English

Scanning Electron Microscopy

2013English

Scanning Electron Microscopy

2012English

Scanning Electron Microscopy

2019English

Scanning Electron Microscopy

2003English

Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution

Microscopy and Microanalysis
Instrumentation
2019English

Scanning Electron Microscopy of Dermatofibroma

Anais Brasileiros de Dermatologia
Dermatology
2019English

High Resolution Examination of Biological Samples Using Field Emission Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2002English

Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2018English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy