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Impacts on the Ratio of Peak to Total and Peak to Source for Si-Pin Detector Through the Monte Carlo Method in XRF Analysis
DEStech Transactions on Engineering and Technology Research
doi 10.12783/dtetr/apop2017/18714
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Date
February 21, 2018
Authors
Hefan LIU
Ye DENG
Xiang HU
Xiaoling ZHOU
Keyin WU
Publisher
DEStech Publications
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