Impacts on the Ratio of Peak to Total and Peak to Source for Si-Pin Detector Through the Monte Carlo Method in XRF Analysis

DEStech Transactions on Engineering and Technology Research
doi 10.12783/dtetr/apop2017/18714
Full Text
Abstract

Available in full text

Date
Authors
Publisher

DEStech Publications

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy