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A Fully Automated System for the Preparation of Samples for Cryo-Electron Microscopy
doi 10.1115/dscc2010-4272
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Date
January 1, 2010
Authors
Zachary J. Thompson
Kevin L. Johnson
Nicolas Overby
Jessica I. Chidi
William K. Pryor
Marcia K. O’Malley
Publisher
ASME