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Systematic Study of Back-Gate Bias Effects in Ultrathin-Box Tri-Gate (UTBT) Transistor With 10nm-Diameter Nanowire Channel
doi 10.7567/ssdm.2012.e-1-5
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Date
September 25, 2012
Authors
K. Ota
M. Saitoh
C. Tanaka
T. Numata
Publisher
The Japan Society of Applied Physics
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