Atomic Force Microscopy Improved Resolution Employing Large Scanning Speeds: Effects of the Double Relaxation Time

Review of Scientific Instruments - United States
doi 10.1063/1.1149143
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

Chemical Phenomena of Atomic Force Microscopy Scanning

English

Scanning Electron Microscopy and Atomic Force Microscopy of Chitosan Composite Films

Journal of the Chilean Chemical Society
Chemistry
2010English

Scanning Electrochemical Microscopy-Atomic Force Microscopy Probes From Pyrolyzed Parylene C

Microscopy and Microanalysis
Instrumentation
2013English

Slip Line Resolution in Atomic Range on Plastically deformedAIII-BVsemiconductor Surface by Scanning Force Microscopy

Acta Crystallographica Section A Foundations of Crystallography
1993English

Polarization Contrast in Photon Scanning Tunnelling Microscopy Combined With Atomic Force Microscopy

Journal of Microscopy
Forensic MedicinePathologyHistology
1995English

Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution

Microscopy and Microanalysis
Instrumentation
2019English

Atomic Force Microscopy

English

Scanning Ion Conductance Microscopy and Atomic Force Microscopy for Live Cell Imaging: A Comparison

Biophysical Journal
Biophysics
2019English

High-Resolution Scanning Force Microscopy of Gold Nanoclusters on the KBr (001) Surface

Physical Review B
2006English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy