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Self-Consistent Scattering Analysis of Al0.2Ga0.8N/AlN/GaN/AlN Heterostructures Grown on 6h-SiC Substrates Using Photo-Hall Effect Measurements
Journal of Physics Condensed Matter
- United Kingdom
doi 10.1088/0953-8984/20/04/045208
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Categories
Materials Science
Condensed Matter Physics
Date
January 8, 2008
Authors
S B Lisesivdin
E Arslan
M Kasap
S Ozcelik
E Ozbay
Publisher
IOP Publishing
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