Self-Consistent Scattering Analysis of Al0.2Ga0.8N/AlN/GaN/AlN Heterostructures Grown on 6h-SiC Substrates Using Photo-Hall Effect Measurements

Journal of Physics Condensed Matter - United Kingdom
doi 10.1088/0953-8984/20/04/045208
Full Text
Abstract

Available in full text

Date
Authors
Publisher

IOP Publishing


Related search