The Mechanics and Physics of Thin Film Decohesion and Its Measurement

Interface Science
doi 10.1007/bf00191045
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Springer Nature

Related search

Measurement and Calculation of PZT Thin Film Longitudinal Piezoelectric Coefficients

Integrated Ferroelectrics
ControlSystems EngineeringCondensed Matter PhysicsElectronic EngineeringMaterials ChemistryOpticalElectricalMagnetic MaterialsCompositesElectronicCeramics
1999English

Fabrication of TiO2 Nanoscale Thin Film and Its Structural Properties

Hacettepe Journal of Biology and Chemistry
2016English

Hot Electron Physics of Alternating-Current Thin-Film Electroluminescent Devices.

1994English

FABRICATION AND MEASUREMENT OF a COPLANAR CIRCULATOR WITH 65 Μm YIG THIN FILM

Progress In Electromagnetics Research Letters
OpticalElectronicMagnetic Materials
2009English

Stagnation Temperature Measurement Using Thin-Film Platinum Resistance Sensors

Measurement Science and Technology
InstrumentationEngineeringApplied Mathematics
2013English

Physics of Ageing in Thin Film Resistors: Oxidation of Clean Chromium Films

1967English

Measurement of Contact-Line Dissipation in a Nanometer-Thin Soap Film

Physical Review E
2015English

Effects of Adhesion on the Measurement of Thin Film Mechanical Properties by Nanoindentation

Materials Research Society Symposium - Proceedings
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
1997English

Room Temperature In-Situ Measurement of the Spin Voltage of a BiSbTe3 Thin Film

Scientific Reports
Multidisciplinary
2020English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy