HR-STEM Imaging and EELS Characterizing of Nano-Scale Defects in Sputter Deposited Thin Films of Double-Perovskite Sr2FeMoO6 (SFMO) and Sr2CrReO6 (SCRO)

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927611009147
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Cambridge University Press (CUP)

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