High Resolution CryoSEM: Examination of Microbial Samples in an In-Lens and a Below-The-Lens FESEM
Microscopy and Microanalysis - United Kingdom
doi 10.1017/s143192760344004x
Full Text
Open PDFAbstract
Available in full text
Categories
Date
August 1, 2003
Authors
Publisher
Cambridge University Press (CUP)