Cross Sectional STEM Imaging and Analysis of Multilayered Two Dimensional Crystal Heterostructure Devices

Microscopy and Microanalysis- United Kingdom

doi 10.1017/s1431927615001336

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Abstract

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Categories

Instrumentation

Date

August 1, 2015

Authors

Aidan P. Rooney

O. Del Pozo Zamudio

Artem Mishchenko

A. I. Tartakovskii

Konstantin. S. Novoselov

Publisher

Cambridge University Press (CUP)

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