Low Dose Rate Effects in Silicon Based Devices and Integrated Circuits: A Review
Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering
doi 10.17073/1609-3577-2016-1-5-21
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Date
June 5, 2018
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National University of Science and Technology MISiS