Using the Λ Function to Evaluate Probe Measurements of Charged Dielectric Surfaces

IEEE Transactions on Dielectrics and Electrical Insulation - United States
doi 10.1109/94.556558
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Related search

Precise Dielectric Property Measurements and E-Field Probe Calibration for Specific Absorption Rate Measurements Using a Rectangular Waveguide

Measurement Science and Technology
InstrumentationEngineeringApplied Mathematics
2009English

Proper Controls to Electrochemically Evaluate Carotenoids Using Β-Cyclodextrin Modified Surfaces

ECS Transactions
Engineering
2017English

Using the Quartz Crystal Microbalance With Dissipation Monitoring to Evaluate the Size of Nanoparticles Deposited on Surfaces

ACS Nano
Materials ScienceNanoscienceEngineeringNanotechnologyAstronomyPhysics
2013English

Laser Raman Measurements of Dielectric Coatings as a Function of Temperature

English

On the Moments of the Carmichael Λ Function

Acta Arithmetica
Number TheoryAlgebra
2006English

Scanning Probe Energy Loss Spectroscopy: Angular Resolved Measurements on Silicon and Graphite Surfaces

Applied Physics Letters
AstronomyPhysics
2000English

Dielectric Properties of Tequila in the Microwave Frequency Range (0.5–20 GHz) Using Coaxial Probe

International Journal of Food Properties
Food Science
2017English

Dielectric Characterization of Vegetation at L Band Using an Open-Ended Coaxial Probe

Geoscientific Instrumentation, Methods and Data Systems
Atmospheric ScienceOceanographyGeology
2018English

Dielectric Characterization of Vegetation at L-Band Using an Open-Ended Coaxial Probe

2018English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy