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Automatic Equipment for Testing of Complex Multiparametric Intelligent Devices
doi 10.1109/sibcon.2017.7998439
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Date
June 1, 2017
Authors
A. Gorchakovsky
V. Evstratko
A. Kamyshnikov
A. Kamyshnikova
A. Mishurov
S. Panko
V. Sukhotin
Publisher
IEEE
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