In-Situ Deformation of Various Micro/Nanoscaled Samples in the Transmission Electron Microscope: Experimental Results and Pitfalls

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927617004470
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Various Specimen Preparation Methods for Transmission Electron Microscope

Journal of the Japan Society of Colour Material
2006English

Electron Tomography With In-Situ Deformation

Materia Japan
2016English

In Situ Reduction and Oxidation of Nickel From Solid Oxide Fuel Cells in a Transmission Electron Microscope

2009English

A Novel Approach for Preparation and in Situ Tensile Testing of Silica Glass Membranes in the Transmission Electron Microscope

Frontiers in Materials
Materials Science
2017English

Anomalous Beam Effects During in Situ Transmission Electron Microscopy Deformation of Nanocrystalline and Ultrafine-Grained Metals

Microscopy and Microanalysis
Instrumentation
2016English

In Situ Transmission Electron Microscope Formation of a Single-Crystalline Bi Film on an Amorphous Substrate

Applied Physics Letters
AstronomyPhysics
2017English

In-Situ Experiment With High Voltage Electron Microscope

Materials Transactions, JIM
1998English

Atomic-Resolution Electron Energy-Loss Spectroscopy in the Scanning Transmission Electron Microscope

Journal of Microscopy
Forensic MedicinePathologyHistology
1995English

In-Situ UHV-Electron Microscopy With Scanning Tunneling Microscope

Microscopy and Microanalysis
Instrumentation
2002English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy