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Measuring the Hot-Electron Population Using Time-Resolved Hard X-Ray Detectors on the NIF

doi 10.1117/12.2024960
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Abstract

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Date

September 26, 2013

Authors
M. HohenbergerN. E. PalmerG. LaCailleE. L. DewaldL. DivolE. J. BondT. DöppnerJ. J. LeeR. L. KauffmanJ. D. SalmonsonC. A. ThomasD. K. BradleyC. StoecklT. C. Sangster
Publisher

SPIE


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