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Performance and Stability of Dedicated Aberration-Corrected STEMs: A User's Perspective

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927614006345
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Abstract

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Categories
Instrumentation
Date

August 1, 2014

Authors
D.M. KepaptsoglouA.R. LupiniD. Mücke-HerzbergG. VaughanQ.M. Ramasse
Publisher

Cambridge University Press (CUP)


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