Performance and Stability of Dedicated Aberration-Corrected STEMs: A User's Perspective

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927614006345
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Understanding Catalyst Stability Through Aberration-Corrected STEM

Microscopy and Microanalysis
Instrumentation
2009English

Sub-Ångstrom Low-Voltage Performance of a Monochromated, Aberration-Corrected Transmission Electron Microscope

Microscopy and Microanalysis
Instrumentation
2010English

A New High Stability, 4th Order Aberration Corrected Spectrometer and Imaging Filter for a Monochromated Tem

Microscopy and Microanalysis
Instrumentation
2002English

Aberration-Corrected Precession Electron Diffraction

Microscopy and Microanalysis
Instrumentation
2007English

Nanomilling for Aberration – Corrected TEM and HAADF STEM

Microscopy and Microanalysis
Instrumentation
2009English

Aberration-Corrected STEM for Elemental Mapping

Microscopy and Microanalysis
Instrumentation
2003English

Surface Channeling in Aberration-Corrected STEM of Nanostructures

Microscopy and Microanalysis
Instrumentation
2010English

Atomic-Resolution EELS in Aberration-Corrected STEM

Microscopy and Microanalysis
Instrumentation
2003English

The Ultimate Resolution in Aberration-Corrected STEM

Microscopy and Microanalysis
Instrumentation
2002English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy