Amanote Research
Register
Sign In
Real-Time X-Ray Microbeam Technique Used to Study Electromigration in Al(Cu) Conductor Lines
MRS Bulletin
- United Kingdom
doi 10.1557/mrs2001.82
Full Text
Open PDF
Abstract
Available in
full text
Categories
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Date
May 1, 2001
Authors
Unknown
Publisher
Cambridge University Press (CUP)
Related search
Local Plastic Strain Measurement by X-Ray Microbeam Diffraction Technique
Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Characterization of Deformation Behavior of Individual Grains in Polycrystalline Cu-Al-Mn Superelastic Alloy Using White X-Ray Microbeam Diffraction
Metals
Materials Science
Synchrotron X-Ray Microdiffraction Studies of Electromigration in Interconnect Lines at the Advanced Light Source
Optical Microscanning X-Ray Real-Time Imaging System
Observation of Fatigue Crack Propagation Process in Cold-Rolled Low-Carbon Steel by X-Ray Microbeam Technique
Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Electromigration of Substitutional Impurities in Metals: Theory and Application in Al and Cu
Physical Review B
Dynamic Study of the Thermoelastic Transformation of Cu-Zn-Al Single Crystals by X-Ray Diffraction
Le Journal de Physique IV
Time-Resolved Soft X-Ray Spectra From Laser-Produced Cu Plasma
Review of Scientific Instruments
Medicine
Instrumentation
In Situ X-Ray Microscopy Studies of Electromigration in Copper Interconnects
AIP Conference Proceedings
Astronomy
Physics