Combined Dry Plasma Etching and Online Metrology for Manufacturing Highly Focusing X-Ray Mirrors

doi 10.1063/1.4952873
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Author(s)

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy